The ILH together with the partners started the new EU project EUREKA Xecs FA2IR (Failure Analysis - AI-Readiness and Application). In FA2IR the ILH will investigate applications of Artificial Intelligence methods to databases in microelectronic failure analysis and develop new methods to integrate heterogeneous data sources for AI-enhanced failure analysis of semiconductor devices.
For more information check the project website:
https://www.ilh.uni-stuttgart.de/en/research/pe/Xecs-FA2IR/
Image: FA2IR