🎉 PCIM 2025 will take place from May 6-8 in Nuremberg - the leading international event for power electronics, intelligent drive technology, renewable energies and energy management!
🧑🔬 We are represented with three exciting conference contributions:
- Aline Reck: “Accuracy Comparison of Temperature Sensors for Thermal Characterization of GaN Transistors” - 06 May, 14:50-15:10
- Ruben Schnitzler: “10 MHz Accelerated Gate-Switching Stress Tests with In-Situ Degradation Monitoring of SiC MOSFETs” - May 06, 15:30-17:00
- Mathias Weiser: “A Simulation Model for SiC Power Devices Including Thermal Effects and Package Parasitics” - May 07, 15:30-17:00
🔬 Visit us on 07.05.2025 in the University Research Zone (Hall 4, Booth 314) and discover our latest research results on “Advanced Reliability Testing, Characterization and Simulation of Wide-Bandgap Semiconductors”!
🤝 Come by and discuss current research in the field of wide-bandgap power semiconductors with us!
More information: https://pcim.mesago.com/nuernberg/en/expo/visitors/university-research-zone.html
