We invite you to discuss these topics with us during an online workshopon
04 March 2021, 09:30–13:45 (CET)
The feedback and stakeholder requirements gathered in two breakout sessions will be included in the ongoing work and the resulting standardization proposals for the International Electrotechnical Commission IEC.
The workshop is aimed at users and developers of power electronic systems as well as manufacturers of power semiconductor and simulation tools.
Register here until 01.March 2021.The workshop is free of charge.
Contact: Alexandra Fabricius, VDE DKE, +49 69 6308-453, email@example.com
04 March 2021, Online Workshop
09:30–09:40 Welcome and Introduction | Alexandra Fabricius, VDE|DKE
09:40–09:50 Converter design: But where do I find the right device model? How a machine-readable datasheet can speed up the design process | Anna-Lena Heller, PE-Systems GmbH
09:50–10:00 Double pulse testing of fast switching devices: challenges and opportunities | Uwe Jansen, Infineon Technologies AG
10:00–10:20 Challenges in Switching-Loss Determination of Fast-Switching Wide-Bandgap Semiconductors | Ying Su, PTB Physikalisch Technische Bundesanstalt | Dominik Koch, Philipp Ziegler, University of Stuttgart
10:20 –10:30 Switch to Breakout Sessions
Track 1:Machine-readable Datasheet:
Requirements, Hurdles, Solutions Vendors of power semiconductor devices have to decide for which of the available simulation tools they provide a model. How convenient the setup of a simulation for a customer is depends on whether they use the “right” tool. In the worst case, the device will not be considered due to the lack of a suitable model. By providing a machine-readable datasheet, the process of device model parametrization can be automated by the toolchain manufacturers. During the breakout session, all stakeholders are able to name and discuss their requirements to be taken up by the project in the standardization activities.
Track 2:Double Pulse Test Setups: Capabilities, Targets, Gaps:
Double pulse testing of power semiconductors is a well-established method for power device characterization at the device manufacturer but with the introduction of wide bandgap devices like SiC new challenges arise. On the other hand, many design engineers are not aware what additional benefits double pulse testing in their own setup could provide. In an interactive session we will collect inputs from the participants to evaluate to what extent the MessLeha project already addresses the gaps and where further work is needed.
12:00–13:00 Lunch Break
13:00–13:30 Workshop Summary and Results | MessLeha Partners
13:30–13:40 Next Steps
13:40–13:45 Closing Remarks | Alexandra Fabricius, VDE|DKE