30. März 2021 / Dominik Koch

Failure Analysis

ILH steps into IoT/AI/ML
[Bild: FA4.0]

ILH has joined the European consortium FA4.0 to develop automated tools to diagnose different failures in microelectronics. ILH is involved in the development of cutting edge tools and method for analyzing, detecting and avoiding defect mechanisms and failures during the manufacturing process in line with Industry 4.0. concepts. Countries involved: Germany, France, Czech Republic, Sweden.

For more information visit: https://penta-eureka.eu/project-overview/penta-call-4/fa4-0/



Dieses Bild zeigt Kanuj Sharma

Kanuj Sharma

Wissenschaftlicher Mitarbeiter

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