Our colleague Oleksandr Solomakha represented ILH at the 9th IEEE Southern Power Electronics Conference (SPEC2024) in Brisbane, Australia, presenting the topic: "Multilevel Digital Twin of Power Electronics Based on Degradable Wide-Bandgap Semiconductors for State-of-Health Estimation."
The research introduces a sophisticated multi-level digital twin for power electronics, meticulously designed to model processes at both the electrical system level and the semiconductor SiC device level, while capturing transient dynamics. A key innovation is the integration of a current-adaptive system, which facilitates precise evaluation of duty cycles—an essential factor in assessing heat losses in power electronics, independently for MOSFETs and body diodes.
The digital twin incorporates an advanced thermal model to accurately replicate dynamic junction temperature behavior. Additionally, experimental data on the on-state drain-source voltage (TSEP) is embedded into the twin, scaled to reflect its exponential degradation characteristics. The model's reliability was rigorously validated using a Power-Hardware-in-the-Loop setup, leveraging two 3-phase 50 kW inverters.
This research was carried out at the ILH, University of Stuttgart, as part of the AUTOtech.agil project (Architecture and Technologies for Orchestrating Automotive Agility), funded by the Federal Ministry of Education and Research of Germany (BMBF).
