This week, the "24th European Conference on Power Electronics and Applications EPE ECCE Europe" was held in Hannover. The ILH was represented by Mathias Weiser and Kanuj Sharma, who contributed to the exciting conference program with the papers "Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network" and "Design Considerations for Fast On‐State Voltage Measurement Circuits".
Kanuj Sharma in the Lecturesession
Mathias Weiser in thePostersession