Dieses Bild zeigt  Kevin Muñoz Barón

Herr M.Sc.

Kevin Muñoz Barón

Wissenschaftlicher Mitarbeiter
Institut für Robuste Leistungshalbleitersysteme

Kontakt

+49 711 685 - 69570
+49 711 685 - 58700

Visitenkarte (VCF)

Pfaffenwaldring 47
70569 Stuttgart
Deutschland
Raum: 1.175

Sprechstunde

flexibel nach vorheriger Anmeldung

Fachgebiet

  1. 2020

    1. Sharma K, Dayanand D, Barón KM, Ruthardt J, Münzenmayer F, Hückelheim J, u. a. A Robust Approach for Characterization of Junction Temperature of SiC Power Devices via Quasi-Threshold Voltage as Temperature Sensitive Electrical Parameter. In: 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) [Internet]. New Orleans, USA; 2020. S. 1532–6. (2020 IEEE Applied Power Electronics Conference and Exposition (APEC)). Verfügbar unter: https://ieeexplore.ieee.org/document/9124609/
    2. Muñoz Barón K, Sharma K, Nitzsche M, Ziegler P, Koch D, Kallfass I. Characterization of Threshold Voltage for Application-Oriented Power Cycling Conditions for Wide-Bandgap Power Devices. In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management [Internet]. VDE Verlag; 2020. S. 1344–50. (International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management). Verfügbar unter: https://ieeexplore.ieee.org/document/9178169
    3. Sharma K, Barón KM, Ruthardt J, Hueckelheim J, Koch D, Muenzenmayer F, u. a. Characterization of the Junction Temperature of SiC Power Devices via Quasi-Threshold Voltage as Temperature Sensitive Electrical Parameter. In: CIPS 2020; 11th International Conference on Integrated Power Electronics Systems [Internet]. Berlin, Germany; 2020. S. 1–6. (CIPS 2020; 11th International Conference on Integrated Power Electronics Systems). Verfügbar unter: https://ieeexplore.ieee.org/document/9097714
    4. Nitzsche M, Barón KM, Ziegler P, Wagner F, Roth-Stielow J. Dynamic AC Power Cycling with Coupled Inverters Operating Under Application-Oriented Conditions. In: VDE, Herausgeber. CIPS 2020; 11th International Conference on Integrated Power Electronics Systems [Internet]. Berlin, Germany; 2020. S. 576–81. (VDE, Reihenherausgeber. CIPS 2020; 11th International Conference on Integrated Power Electronics Systems). Verfügbar unter: https://ieeexplore.ieee.org/document/9097745
  2. 2019

    1. Ruthardt J, Muñoz Barón K, Marx P, Sharma K, Nitzsche M, Fischer M, u. a. Online Junction Temperature Measurement via Internal Gate Resistance Using the High Frequency Gate Signal Injection Method. In: PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. VDE Verlag; 2019. S. 1–7. (PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management).
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