Herr M.Sc.

Kevin Muñoz Barón

Wissenschaftlicher Mitarbeiter
Institut für Robuste Leistungshalbleitersysteme

Kontakt

+49 711 685 - 69570
+49 711 685 - 58700

Visitenkarte (VCF)

Pfaffenwaldring 47
70569 Stuttgart
Deutschland
Raum: 1.175

  1. 2019

    1. J. Ruthardt et al., “Online Junction Temperature Measurement via Internal Gate Resistance Using the High Frequency Gate Signal Injection Method,” in PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2019, pp. 1–7, [Online]. Available: https://ieeexplore.ieee.org/document/8767601/.
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